Abstract: Low-power test generation procedure targets the switching activity during the fast functional clock cycles of broadside tests. The procedure is based on Test Cubes merging using Test Point Insertion that it extracts from functional broadside tests. Test cube merging supports test compaction and test point insertion improves fault coverage. The use of functional broadside tests provides a target for the switching activity of low-power tests, not exceeding the switching activity that is possible during functional operation. The use of test cubes that are extracted from functional broadside tests is a unique feature. It ensures that the low-power tests would create functional operation conditions in sub circuits that are defined by the test cubes and test point insertion reduces the complexity involved in detecting additional faults. Experimental results show that the procedure detects all or almost all the transition faults that are detectable by arbitrary (functional and non-functional) broadside tests in benchmark circuits. The simulation results are obtained using MODELSIM 6.3f and the power is analysed using XILINX 8.1 software.

Keywords: Functional broadside tests, low-power test generation, test cubes, test point insertion, transition faults